Object

Creator:

Xu, Xiaoqing ; Xie, Ming ; Chen, Song ; Ji, Ying ; Wang, Yawei

Contributor:

Urbańczyk, Wacław. Redakcja

Description:

Optica Applicata, Vol. 52, 2022, nr 1, s. 101-116 ; Optica Applicata is an international journal, published in a non-periodical form in the years 1971-1973 and quarterly since 1973. From the beginning of the year 2008, Optica Applicata is an Open Access journal available online via the Internet, with free access to the full text of articles serving the best interests of the scientific community. The journal is abstracted and indexed in: Chemical Abstracts, Compendex, Current Contents, Inspec, Referativnyj Zhurnal, SCI Expanded, Scopus, Ulrich’s Periodicals Directory ; click here to follow the link

Abstrakt:

The interferogram containing the noises often affects the accuracy of phase retrieval, leading to the degradation of the phase imaging quality. To address this issue, a new interferogram blind denoising (IBD) method based on deep residual learning is proposed. In the presence of unknown noise levels, during the training, the deep residual convolutional neural networks (DRCNN) in the IBD approach is able to remove the latent clean interferogram implicitly, and then gradually establish the residual mapping relation in the pixel-level between the interferogram and the noises. With a well-trained DRCNN model, this algorithm can deal not only with the single-frame interferogram efficiently but also with the multi-frame phase-shifted interferograms collaboratively, while effectively retaining interferogram features related to phase retrieval. Simulation and experimental results demonstrate the feasibility and applicability of the proposed IBD method.

Publisher:

Oficyna Wydawnicza Politechniki Wrocławskiej

Place of publication:

Wrocław

Date:

2022

Resource Type:

artykuł

Resource Identifier:

doi:10.37190/oa220108

Source:

<sygn. PWr A3481II> ; click here to follow the link ; click here to follow the link

Language:

eng

Relation:

Optica Applicata ; Optica Applicata, Vol. 52, 2022 ; Optica Applicata, Vol. 52, 2022, nr 1 ; Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki

Rights:

Wszystkie prawa zastrzeżone (Copyright)

Access Rights:

Dla wszystkich w zakresie dozwolonego użytku

Location:

Politechnika Wrocławska