Title:

Microphotoreflectance spectroscopy – a modulation technique with high spatial resolution

Group publication title:

Optica Applicata

Creator:

Sęk, Grzegorz ; Podemski, Paweł ; Rudno-Rudziński, Wojciech ; Gumienny, Zbigniew ; Misiewicz, Jan

Contributor:

Gaj, Miron. Redakcja

Subject and Keywords:

optyka ; photoreflectance ; high resolution ; microphotoreflectance

Description:

Optica Applicata, Vol. 37, 2007, nr 4, s. 439-447

Abstrakt:

There is presented an experimental setup for the measurements of photomodulated reflectivity spectra of low-dimensional semiconductor structures with a micrometer spatial (plane) resolution. The setup has been developed as an extended and improved version of a standard bright configuration, i.e., where the probe beam is provided directly by a broad band light source (e.g., halogen lamp) and then it is dispersed after being reflected off the sample. It gives typically the plane resolution, expressed by the spot size of the beams on the sample surface, on the level of single millimetres. Introducing optics, based on a long working distance and a high numerical aperture microscope objective, has allowed decreasing the spot size by three orders of magnitude into the micrometer range for both the probe and the pump beams. The optimization of microphotoreflectance signal to noise ratio has made it possible to detect the normalized reflectivity coefficient changes (ΔR/R) from an ultrathin single quantum well formed of the wetting layer in the structure with self-assembled InAs /GaAs quantum dots and from single pillar microresonators of the lateral sizes in the range of single micrometers.

Publisher:

Oficyna Wydawnicza Politechniki Wrocławskiej

Place of publication:

Wrocław

Date:

2007

Resource Type:

artykuł

Source:

<sygn. PWr A3481II> ; click here to follow the link ; click here to follow the link

Language:

eng

Relation:

Optica Applicata ; Optica Applicata, Vol. 37, 2007 ; Optica Applicata, Vol. 37, 2007, nr 4 ; Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki

Rights:

Wszystkie prawa zastrzeżone (Copyright)

Access Rights:

Dla wszystkich w zakresie dozwolonego użytku

Location:

Politechnika Wrocławska