Advanced search ?

Object

AFM examination of sol–gel matrices doped with photosensitizers
Download

Title: AFM examination of sol–gel matrices doped with photosensitizers

Creator:

Wysocka, Katarzyna ; Ulatowska-Jarża, Agnieszka ; Bauer, Joanna ; Hołowacz, Iwona ; Savu, Bogdan ; Stanciu, George ; Podbielska, Halina

Contributor:

Gaj, Miron. Redakcja ; Urbańczyk, Wacław. Redakcja

Description:

Optica Applicata, Vol. 38, 2008, nr 1, s. 127-136

Abstrakt:

Various compounds may be entrapped into the sol–gel materials, including the photosensitive agents. The nanostructure of the final material depends on the matrix itself, as well as on the structural properties of doped compound. In this work, sol–gel matrices were produced from silica based precursor tetraethoxysilan (TEOS) in the form of single layers deposited on microscopic glasses. Materials were produced with molar ratios R = 20, 32, 40 (R – the number of solvent (ethanol) moles to the number of precursor (TEOS) moles). Additionally, for each material two various concentrations of photosensitizers were prepared (0.5 mg/ml and 0.05 mg/ml). On the basis of AFM images from Atomic Force Microscope Quesant 350, the following roughness parameters were evaluated: roughness average, peak–peak height, surface skewness and fractal dimension. The roughness average Sa parameter gives information about the statistical average properties. The peak–peak height Sy is defined as the height difference between the highest and the lowest pixel in the image. The surface skewness Ssk describes the asymmetry of the height distribution histogram. The fractal dimension Sfd is calculated for the different angles by analyzing the Fourier amplitude spectrum. Comparing the results we stated that average roughness increases with increasing R factor for protoporphyrine IX dimethylester (PPIX) (dimethyl-8, 13-divinyl-3, 7, 12, 17-tetramethyl-21H, 23H-porphine-2, 18-dipropionate) and photolon (18-carboxy-20-(carboxymethyl)-8-ethenyl-13-ethyl-2, 3-dihydro-3, 7, 12, 17-tetramethyl-21H, 23H-porphin-2-propionic acid) in higher concentrations. This means that photosensitizers used as dopants influence the smoothness of sol–gel matrix. We also noticed that the smallest roughness is observed in the material doped with PPIX in higher concentration. This was stated for all the images analyzed. This indicates that sol–gel matrix enclosures the PPIX molecules, resulting in smooth material.

Publisher:

Oficyna Wydawnicza Politechniki Wrocławskiej

Place of publication:

Wrocław

Date:

2008

Resource Type:

artykuł

Resource Identifier:

oai:dbc.wroc.pl:62841

Source:

<sygn. PWr A3481II> ; click here to follow the link ; click here to follow the link

Language:

eng

Relation:

Optica Applicata ; Optica Applicata, Vol. 38, 2008 ; Optica Applicata, Vol. 38, 2008, nr 1 ; Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki

Rights:

Wszystkie prawa zastrzeżone (Copyright)

Access Rights:

Dla wszystkich w zakresie dozwolonego użytku

Location:

Politechnika Wrocławska

Group publication title:

Optica Applicata

Subject and keywords:

optyka atomic force microscope (AFM) sol–gel material nanostructure photosensitizers

Object collections:

Last modified:

Mar 21, 2019

In our library since:

Mar 21, 2019

Number of object content hits:

58

All available object's versions:

https://dbc.wroc.pl./publication/113959

Show description in RDF format:

RDF

Show description in OAI-PMH format:

OAI-PMH

Edition name Date
AFM examination of sol–gel matrices doped with photosensitizers Mar 21, 2019

Similar

Optica Applicata
Optica Applicata

Fluorescence properties of sol–gel materials doped with photosensitizers

Hołowacz, Iwona Ulatowska-Jarża, Agnieszka Wysocka, Katarzyna Głuchowski, Paweł Stręk, Wiesław Podbielska, Halina Gaj, Miron. Redakcja Urbańczyk, Wacław. Redakcja

2008
artykuł
Optica Applicata
Optica Applicata

Viscosity, surface tension and refractive index of tetraethylorthosilicate-based sol-gel materials depending on ethanol content

Hołowacz, Iwona Podbielska, Halina Bauer, Joanna Ulatowska-Jarża, Agnieszka Gaj, Miron. Redakcja Wilk, Ireneusz. Redakcja

2005
artykuł
Optica Applicata
Optica Applicata

Silica-based versus silica-titania sol–gel materials – comparison of the physical properties: surface tension, gelation time, refractive index and optical transmittance

Ulatowska-Jarża, Agnieszka Hołowacz, Iwona Wysocka, Katarzyna Podbielska, Halina Gaj, Miron. Redakcja Urbańczyk, Wacław. Redakcja

2009
artykuł
Optica Applicata
Optica Applicata

Biosensor for urea detection based on sol-gel technology

Ulatowska-Jarża, Agnieszka Podbielska, Halina Gaj, Miron. Redakcja Wilk, Ireneusz. Redakcja

2002
artykuł
Optica Applicata
Optica Applicata

Sol-gel protective layer for fiberoptic chemical microsensors

Andrzejewski, Damian Podbielska, Halina Ulatowska-Jarża, Agnieszka Gaj, Kazimierz. Redakcja Wilk, Ireneusz. Redakcja

2000
artykuł
Optica Applicata
Optica Applicata

Influence of sample preparation methods on transmission electron micrographs of sol-gel materials

Jeleń, Łukasz Cegielski, Marek Ulatowska-Jarża, Agnieszka Podbielska, Halina Gaj, Miron. Redakcja Wilk, Ireneusz. Redakcja

2002
artykuł
Optica Applicata
Optica Applicata

Computer-aided microscopic examination of the structure of sol-gel glasses prepared in the form of thin films

Ulatowska-Jarża, Agnieszka Lechna-Marczyńska, Monika Podbielska, Halina Gaj, Kazimierz. Redakcja Wilk, Ireneusz. Redakcja

2000
artykuł
Optica Applicata
Optica Applicata

Influence of heating temperature on structural properties of sol-gel materials

Bauer, Joanna Ulatowska-Jarża, Agnieszka Podbielska, Halina Lechna-Marczyńska, Monika Bindig, Uwe Müller, Gerhard Beuthan, Jürgen Gaj, Miron. Redakcja Wilk, Ireneusz. Redakcja

2005
artykuł
More
×

Citation

Citation style:

Contact details

Address

Wrocław University of Science and Technology (Coordinator)
Library of Wrocław University of Science and Technology
Wybrzeże Wyspiańskiego 27
50-370 Wrocław, Poland

Phone

(+48) 71-320-38-30
(+48) 71-320-47-50

E-Mail

bc@pwr.edu.pl

Visit us!

https://biblioteka.pwr.edu.pl/

This page uses 'cookies'. More information