Title:

Application of microscope thermography in testing temperature distribution in a semiconductor laser

Group publication title:

Optica Applicata

Creator:

Rybiński, Janusz ; Bednarek, Michał ; Wiśniewski, Przemysław ; Świetlik, Tomasz

Contributor:

Gaj, Miron. Redakcja ; Urbańczyk, Wacław. Redakcja

Subject and Keywords:

optyka ; microscope thermography ; blue lasers ; semiconductor lasers

Description:

Optica Applicata, Vol. 40, 2010, nr 3, s. 609-614

Abstrakt:

Microscope thermography with the use of thermovision camera with spatial resolution 8 μm was applied in testing temperature distribution in semiconductor lasers produced on the basis of nitrides. The conducted tests have shown that the microscope thermography has a potential in characterizing microelectronic devices like semiconductor laser diodes and can be considered as a complementary tool in establishing thermal characteristics of these devices.

Publisher:

Oficyna Wydawnicza Politechniki Wrocławskiej

Place of publication:

Wrocław

Date:

2010

Resource Type:

artykuł

Source:

<sygn. PWr A3481II> ; click here to follow the link ; click here to follow the link

Language:

eng

Relation:

Optica Applicata ; Optica Applicata, Vol. 40, 2010 ; Optica Applicata, Vol. 40, 2010, nr 3 ; Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki

Rights:

Wszystkie prawa zastrzeżone (Copyright)

Access Rights:

Dla wszystkich w zakresie dozwolonego użytku

Location:

Politechnika Wrocławska