Title:

Distribution of electronic states in amorphous Zn-P thin films on the basis of optical measurements

Group publication title:

Optica Applicata

Creator:

Jarząbek, Bożena ; Weszka, Jan ; Cisowski, Jan

Contributor:

Gaj, Miron. Redakcja ; Urbańczyk, Wacław. Redakcja

Subject and Keywords:

optyka ; amorphous semiconductors ; thin films ; absorption coefficient ; model of electronic structure

Description:

Optica Applicata, Vol. 38, 2008, nr 3, s. 575-583

Abstrakt:

Transmission and fundamental reflectivity studies, completed on amorphous Zn-P thin films, allowed us to obtain parameters describing the fundamental absorption edge, i.e., the optical pseudogap EG, Urbach energy EU and exponential edge parameter ET. All these data, together with the results of earlier transport measurements, have been utilized in developing simple models of electronic structure (distribution of electronic states) for amorphous Zn-P thin films of two compositions, i.e., Zn57P43 (near stoichiometry of Zn3P2) and Zn32P68 (near stoichiometry of ZnP2).

Publisher:

Oficyna Wydawnicza Politechniki Wrocławskiej

Place of publication:

Wrocław

Date:

2008

Resource Type:

artykuł

Source:

<sygn. PWr A3481II> ; click here to follow the link ; click here to follow the link

Language:

eng

Relation:

Optica Applicata ; Optica Applicata, Vol. 38, 2008 ; Optica Applicata, Vol. 38, 2008, nr 3 ; Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki

Rights:

Wszystkie prawa zastrzeżone (Copyright)

Access Rights:

Dla wszystkich w zakresie dozwolonego użytku

Location:

Politechnika Wrocławska