@misc{Kaewon_Rapeepan_Utilization_2020,
 author={Kaewon, Rapeepan and Pawong, Chutchai and Chitaree, Ratchapak and Lertvanithphol, Tossaporn and Bhatranand, Apichai},
 contributor={Urbańczyk, Wacław. Redakcja},
 identifier={DOI: 10.37190/oa200106},
 year={2020},
 rights={Wszystkie prawa zastrzeżone (Copyright)},
 description={Optica Applicata, Vol. 50, 2020, nr 1, s. 69-81},
 publisher={Oficyna Wydawnicza Politechniki Wrocławskiej},
 language={eng},
 type={artykuł},
 title={Utilization of the cyclic interferometer in polarization phase-shifting technique to determine the thickness of transparent thin-films},
 keywords={optyka, polarization phase-shifting technique, cyclic interferometric configuration, non-destructive thickness measurements, transparent thin-films},
}